Boundary Scan

We are all dealing with the test of modern electronics all the time, from prototype work in the lab through to production.

Modern PCBs provide more and more functionality on less and less space. Your PCBs are equipped with a lot of components whose pins are increasingly non-accessible by In-Circuit Tester nails.

Access to the Unit Under Test (UUT) to execute a required application is the central problem for all test processes.

Utilising Embedded System Access technologies (ESA) provides the opportunity to use standardised instrumentation platforms based on JTAG/Boundary Scan throughout the entire product life cycle, reusing existing applications and increasing the fault coverage in the production test.